This book covers both practical and theoretical aspects of atomic resolution transmission electron microscopy. The discovery of the carbon nanotube, the three-dimensional imaging of the ribosome, and the imaging of a single foreign atom inside a thin crystal by energy-filtered transmission electron microscopy have all demonstrated the immense power of this technique. The recent development of aberration-correction devices has brought the spatial resolution of the method below one Angstrom. The emphasis throughout is on a clear presentation of fundamental concepts, and practical advice. The chapters review simple electron optics, phase contrast theory, coherence theory, and imaging theory for thin crystals. The multiple scattering theory is given in full, and the relationship between the various formulations (Bloch-wave, multislice, scattering matrix, Howie–Whelan equations, phase grating etc) is explained. Applications in biology and materials science are covered, with discussions of radiation damage, sample preparation, image processing and super-resolution, electron holography, and aberration correction. The theory of high-angle annular dark field Z-contrast imaging by scanning transmission electron microscopy is given in full. Additional chapters are devoted to electron sources and detectors, fault diagnosis, experimental methods and associated techniques such as channelling effects in X-ray microanalysis, microdiffraction, cathodoluminescence, environmental microscopy and electron energy-loss spectroscopy.