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02280nam a22002297a 4500 |
| 003 - CONTROL NUMBER IDENTIFIER |
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IN-MiVU |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
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20190830114015.0 |
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180424s2010 xxu||||go|||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
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| International Standard Book Number |
9780191708664 ( e-book ) |
| 040 ## - CATALOGING SOURCE |
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| Original cataloging agency |
MAIN |
| Language of cataloging |
eng |
| Transcribing agency |
IN-MiVU |
| 041 0# - LANGUAGE CODE |
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| Language code of text/sound track or separate title |
eng |
| 100 1# - MAIN ENTRY--PERSONAL NAME |
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| Personal name |
Spence, John C. H. |
| 245 00 - TITLE STATEMENT |
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| Title |
High-Resolution Electron Microscopy [ electronic resource ] / |
| Statement of responsibility, etc. |
by John C. H. Spence. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. |
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| Name of publisher, distributor, etc. |
Oxford Scholarship Online, |
| Date of publication, distribution, etc. |
2010 |
| 520 ## - SUMMARY, ETC. |
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| Summary, etc. |
This book covers both practical and theoretical aspects of atomic resolution transmission electron microscopy. The discovery of the carbon nanotube, the three-dimensional imaging of the ribosome, and the imaging of a single foreign atom inside a thin crystal by energy-filtered transmission electron microscopy have all demonstrated the immense power of this technique. The recent development of aberration-correction devices has brought the spatial resolution of the method below one Angstrom. The emphasis throughout is on a clear presentation of fundamental concepts, and practical advice. The chapters review simple electron optics, phase contrast theory, coherence theory, and imaging theory for thin crystals. The multiple scattering theory is given in full, and the relationship between the various formulations (Bloch-wave, multislice, scattering matrix, Howie–Whelan equations, phase grating etc) is explained. Applications in biology and materials science are covered, with discussions of radiation damage, sample preparation, image processing and super-resolution, electron holography, and aberration correction. The theory of high-angle annular dark field Z-contrast imaging by scanning transmission electron microscopy is given in full. Additional chapters are devoted to electron sources and detectors, fault diagnosis, experimental methods and associated techniques such as channelling effects in X-ray microanalysis, microdiffraction, cathodoluminescence, environmental microscopy and electron energy-loss spectroscopy. |
| 650 10 - SUBJECT ADDED ENTRY--TOPICAL TERM |
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| Topical term or geographic name entry element |
Physics |
| 655 #4 - INDEX TERM--GENRE/FORM |
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| Genre/form data or focus term |
Electronic books |
| 856 40 - ELECTRONIC LOCATION AND ACCESS |
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| Uniform Resource Identifier |
<a href="https://doi.org/10.1093/acprof:oso/9780199552757.001.0001">https://doi.org/10.1093/acprof:oso/9780199552757.001.0001</a> |
| Link text |
https://doi.org/10.1093/acprof:oso/9780199552757.001.0001 |
| Public note |
View to click |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
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| Source of classification or shelving scheme |
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| Koha item type |
E-Book |
