TY  - BOOK
AU  - Eaton,Peter
AU  - West,Paul
TI  - Atomic Force Microscopy [ electronic resource ]
SN  - 9780191722851 ( e-book )
PY  - 2010///
PB  - Oxford Scholarship Online
KW  - Physics
KW  - Electronic books
N2  - Atomic force microscopy (AFM) is an amazing technique that allies a versatile methodology (it allows the imaging of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques; it also allows us to make measurements of magnetic, electrical or mechanical properties of the widest possible range of samples, with nanometre resolution. This book will demystify AFM for the reader, making it easy to understand, and easy to use. Peter Eaton and Paul West share a common passion for atomic force microscopy. However, they have very different perspectives on the technique. Over the past 12 years Peter used AFMs as the focal point of his research in a variety of scientific projects from materials science to biology. Paul, on the other hand, is an instrument builder and has spent the past 25 years creating these microscopes for scientists and engineers. This insightful book covers the theory, practice and applications of atomic force microscopes and will serve as an introduction to AFM for scientists and engineers that want to learn about this powerful technique, and as a reference book for expert AFM users. Application examples from the physical, materials, and life sciences, nanotechnology and industry illustrate the many and varied capabilities of the technique
UR  - https://doi.org/10.1093/acprof:oso/9780199570454.001.0001
ER  -