Bunke, Horst. <br/><br/>
Applied pattern recognition /  
edited by Horst Bunke, Abraham Kandel and Mark Last. 
 - /   . 
 - NewYork :   Springer-Verlag ,   2008. 
 - 243p. :   figures ;   23cm .  
<br/><br/>Includes index 
<br/><br/><label>ISBN: </label>9783540768302  EUR99.95 
<br/><br/><label>Subjects--Index Terms: </label>COMPUTER METHODS 
<br/><br/><label>Dewey Class. No.: </label>006.4  / BUN/A