Microstructural characterization of materials / by David Brandon and Wayne D Kaplan.
By: Brandon, David.
Contributor(s): Kaplan, Wayne D.
Material type: TextSeries: Quantitative software engineering series, NULL. Quantitative software engineering series, NULL.Publisher: England : John Wiley & Sons , 2008Edition: 2nd ed.Description: xiv,536p. : ills.,figs. ; 25cm 1 CD.ISBN: 9780470027844.Subject(s): MATERIALS-MICROSCOPY | MICROSTRUCTUREDDC classification: 620.11299Item type | Current location | Call number | Copy number | Status | Date due | Barcode |
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Text Book | Central Library Reading Room (Library Annex) | 620.11299 BRA/M (Browse shelf) | 1 | Not For Loan | 85204 |
Includes bibliographical references and index
85204 USD 210.00
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