Applied pattern recognition / edited by Horst Bunke, Abraham Kandel and Mark Last.
By: Bunke, Horst.
Contributor(s): Kandel, Abraham | Last, Mark.
Material type:
TextPublisher: NewYork : Springer-Verlag , 2008Edition: .Description: 243p. : figures ; 23cm.ISBN: 9783540768302.Subject(s): COMPUTER METHODSDDC classification: 006.4
| Item type | Current location | Call number | Copy number | Status | Date due | Barcode |
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Books
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Central Library General Stacks | 006.4 BUN/A (Browse shelf) | 1 | Available | 80419 |
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| 006.37 SON/I Image processing, analysis, and machine vision / | 006.37 SON/I Image processing, analysis, and machine vision / | 006.37 SON/I Image processing, analysis, and machine vision / | 006.4 BUN/A Applied pattern recognition / | 006.4 DEV/P Pattern recognition : | 006.4 DEV/P Pattern recognition : | 006.4 DEV/P Pattern recognition : |
Includes index
80419 EUR99.95
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