| 000 -LEADER |
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| fixed length control field |
02132nam a22002417a 4500 |
| 003 - CONTROL NUMBER IDENTIFIER |
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| control field |
IN-MiVU |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
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| control field |
20190830114349.0 |
| 006 - FIXED-LENGTH DATA ELEMENTS--ADDITIONAL MATERIAL CHARACTERISTICS |
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m|||||o||d| 00| 0 |
| 007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION |
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cr uuu---uuuuu |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
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| fixed length control field |
180425s2010 xxu||||go|||| 00| 0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
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| International Standard Book Number |
9780191722851 ( e-book ) |
| 040 ## - CATALOGING SOURCE |
|---|
| Original cataloging agency |
MAIN |
| Language of cataloging |
eng |
| Transcribing agency |
IN-MiVU |
| 041 0# - LANGUAGE CODE |
|---|
| Language code of text/sound track or separate title |
eng |
| 100 1# - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
Eaton, Peter |
| 245 00 - TITLE STATEMENT |
|---|
| Title |
Atomic Force Microscopy [ electronic resource ] / |
| Statement of responsibility, etc. |
by Peter Eaton and Paul West. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. |
|---|
| Name of publisher, distributor, etc. |
Oxford Scholarship Online, |
| Date of publication, distribution, etc. |
2010 |
| 520 ## - SUMMARY, ETC. |
|---|
| Summary, etc. |
Atomic force microscopy (AFM) is an amazing technique that allies a versatile methodology (it allows the imaging of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques; it also allows us to make measurements of magnetic, electrical or mechanical properties of the widest possible range of samples, with nanometre resolution. This book will demystify AFM for the reader, making it easy to understand, and easy to use. Peter Eaton and Paul West share a common passion for atomic force microscopy. However, they have very different perspectives on the technique. Over the past 12 years Peter used AFMs as the focal point of his research in a variety of scientific projects from materials science to biology. Paul, on the other hand, is an instrument builder and has spent the past 25 years creating these microscopes for scientists and engineers. This insightful book covers the theory, practice and applications of atomic force microscopes and will serve as an introduction to AFM for scientists and engineers that want to learn about this powerful technique, and as a reference book for expert AFM users. Application examples from the physical, materials, and life sciences, nanotechnology and industry illustrate the many and varied capabilities of the technique. |
| 650 10 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Physics |
| 655 #4 - INDEX TERM--GENRE/FORM |
|---|
| Genre/form data or focus term |
Electronic books |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
West, Paul |
| Relator term |
joint author |
| 856 40 - ELECTRONIC LOCATION AND ACCESS |
|---|
| Uniform Resource Identifier |
<a href="https://doi.org/10.1093/acprof:oso/9780199570454.001.0001">https://doi.org/10.1093/acprof:oso/9780199570454.001.0001</a> |
| Link text |
https://doi.org/10.1093/acprof:oso/9780199570454.001.0001 |
| Public note |
View to click |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
|---|
| Source of classification or shelving scheme |
|
| Koha item type |
E-Book |
